“Exploring and Predicting Genetic Causes of Yield Variation in Winter Wheat”

At Vibe Imaging Analytics we’re proud that our QM3 machine was used by Dr Dewitt in his research and congratulate him on completing his PhD!

His dissertation: “Exploring and Predicting Genetic Causes of Yield Variation in Winter Wheat”, under the direction of Professor Brown-Guedira, is available online.

Here’s an excerpt from the abstract and a download link:

“For most economically important plant species, yield is the primary focus of crop improvement, as increasing it increases the amount of food that can be obtained from a production system by human activity. Growers of soft red winter wheat (Triticum aestivum L.) receive a return on investment in proportion to their per-acre yield, given that harvested grain meets quality standards. Yield is also genetically complex, integrating information on interactions between genotype and environment that occur over the course of a growing season. Yield relates to the total accumulated and reallocated resources obtained by plants over the course of their lives, and any factors that affect any aspect of plant growth and development will also affect yield. These complex interactions between genetic variation and environmental variation are difficult to untangle. By understanding important parts of those interactions, breeders and geneticists may better develop cultivars that maximize performance across a range of possible environmental conditions.”

Exploring and Predicting Genetic Causes of Yield Variation in Winter Wheat. (ncsu.edu)